1. Proceedings of National Seminar on Active and Smart Materials (NSASM-2012) “X-ray Photoelectron Spectroscopy (XPS) Study of Exchange Coupled FM/AFM (Fe/NiO) Bilayer Interfaced with Silicon (Si)” ISBN: 978-93-82062-10-3 held at Deptt. of Applied Physics, Madan Mohan Malaviya University of Technology (formerly M.M.M. Engineering College), Gorakhpur (U.P.), India from March 23-24, 2012.